Secondary ion mass spectrometry SIMS II; Proceeding of the second International Conference on Secondary Ion Mass Spectrometry )SIMS II( Stanford University, Stanford, California, USA August 27-31, 1979
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
Springer-Verlag
Date of Publication, Distribution, etc.
1979
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xiii, 269p
SERIES
Other Title Information
Springer series in chemical physics; v.9
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
editors, A.Benninghoven... ]et.al[
ORIGINAL VERSION NOTE
Text of Note
1
TOPICAL NAME USED AS SUBJECT
Entry Element
Congresses ، Mass spectrometry
LIBRARY OF CONGRESS CLASSIFICATION
Class number
QD
450
.
S65
v
.
9
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU Benninghoven, A
TI
SE
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
Entry Element
International Conference on Secondary Ion Mass Spectrometry, 2d, Stanford University, 1979