Fundamentals of semiconductor manufacturing and process control
General Material Designation
[Book]
First Statement of Responsibility
/ Gary S. May, Costas J. Spanos
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
[Piscataway]
Name of Publisher, Distributor, etc.
: IEEE ; Hoboken, N.J. : Wiley-Interscience,
Date of Publication, Distribution, etc.
, c2006.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xix, 463 p. , ill. , 25 cm.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
CONTENTS NOTE
Text of Note
Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis.