proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
c2000
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xvi, 577 p. :
Other Physical Details
ill. ;
Dimensions
27 cm +
Accompanying Material
1 computer laser optical disc (4 3/4 in.)
GENERAL NOTES
Text of Note
Sponsored by EDFAS, ISTFA
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
PARALLEL TITLE PROPER
Parallel Title
Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis
Parallel Title
Proceedings of the 26th International Symposium or Testing and Failure Analysis
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
International Symposium for Testing and Failure Analysis(26th :2000 :, Bellevue, Wash.)