عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
0871707012
dltt
ISTFA 2000 :
[Book]
proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington
Materials Park, Ohio :
ASM International,
c2000
xvi, 577 p. :
ill. ;
27 cm +
1 computer laser optical disc (4 3/4 in.)
Sponsored by EDFAS, ISTFA
Includes bibliographical references and index
Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis
Proceedings of the 26th International Symposium or Testing and Failure Analysis
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
International Symposium for Testing and Failure Analysis(26th :2000 :, Bellevue, Wash.)
ASM International
Electronic Device Failure Analysis Society
20030617161042.0
مطالعه متن کتاب [Book]
Y
