Menu
Home
Advanced Search
Directory of Libraries
Languages
فارسی
English
العربی
عنوان
Tutorial test generation for VLSI chips
پدید آورنده
]edited by[ Vishwani D. Agrawal and Sharad C. Seth
موضوع
Very large scale integration - Testing ، Integrated circuits,، Automatic checkout equipment
رده
TK
7874
.
T8857
1988
کتابخانه
Central Library and Information Center of Ferdowsi University of Mashhad
محل استقرار
استان:
Khorasan Razavi
ـ شهر:
Mashhad
تماس با کتابخانه :
05138806503
OTHER STANDARD IDENTIFIER
Standard Number
19489
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Tutorial test generation for VLSI chips
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Washington, D.C.: Computer Society Press; Los Angeles, CA
Name of Publisher, Distributor, etc.
Order from Computer Society
Date of Publication, Distribution, etc.
c1988
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 401p.: ill
GENERAL NOTES
Text of Note
"Computer Society order number 786"
Text of Note
"IEEE Catalog number EHO278-2"
Text of Note
Bibliography: p. 333-394
Text of Note
Includes index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
]edited by[ Vishwani D. Agrawal and Sharad C. Seth
TOPICAL NAME USED AS SUBJECT
Entry Element
Very large scale integration - Testing ، Integrated circuits
Entry Element
، Automatic checkout equipment
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
T8857
1988
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
TI
AU Agrawal, Vishwani D. 1943-
AU Seth, Sharad C.
CO IEEE Computer Society
TI Test generation for VLSI chips
LOCATION AND CALL NUMBER
Call Number Suffix
CL
Proposal/Bug Report
×
Proposal/Bug Report
×
Warning!
Enter The Information Carefully
Error Report
Proposal