19489
Tutorial test generation for VLSI chips
Washington, D.C.: Computer Society Press; Los Angeles, CA
Order from Computer Society
c1988
x, 401p.: ill
"Computer Society order number 786"
"IEEE Catalog number EHO278-2"
Bibliography: p. 333-394
Includes index
]edited by[ Vishwani D. Agrawal and Sharad C. Seth
Very large scale integration - Testing ، Integrated circuits
، Automatic checkout equipment
TK
7874
.
T8857
1988
TI
AU Agrawal, Vishwani D. 1943-
AU Seth, Sharad C.
CO IEEE Computer Society
TI Test generation for VLSI chips
CL
