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Electronics reliability and measurement technology : nondestructive evaluation
پدید آورنده
موضوع
، Integrated circuits- Testing- Congresses,، Integrated circuits- Reliability- Congresses,، Non- destructive testing- Congresses
رده
کتابخانه
Library of Niroo Research Institue
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
9
-
88079401
-
021
OTHER STANDARD IDENTIFIER
Standard Number
7086
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Electronics reliability and measurement technology : nondestructive evaluation
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Park Ridge, N.J., U.S.A.
Name of Publisher, Distributor, etc.
Noyes Data Corp.
Date of Publication, Distribution, etc.
c1988
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 128 p. :ill. ;27 cm
GENERAL NOTES
Text of Note
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"- - P. vii
Text of Note
Includes bibliographies and index.
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits- Testing- Congresses
Entry Element
، Integrated circuits- Reliability- Congresses
Entry Element
، Non- destructive testing- Congresses
DEWEY DECIMAL CLASSIFICATION
Number
621
.
381/028/7
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
E486
1988
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
TI
Entry Element
edited by Joseph S. Heyman
AU .S hpesoJ ,namyeH
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