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Thermal testing of integrated circuits
پدید آورنده
Altet, Josep
موضوع
، Integrated circuits-- Testing,، Integrated circuits-- Thermal properties,، Temperature measurements
رده
TK
7874
.
A44
2002
کتابخانه
Central Library of Sharif University of Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
66005817
-
021
OTHER STANDARD IDENTIFIER
Standard Number
139849
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
بهار۵۸
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
General Material Designation
)50(
First Statement of Responsibility
Altet, Josep
Title Proper
Thermal testing of integrated circuits
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
2002
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xiv, 204 p.: ill.; 25 cm
GENERAL NOTES
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits-- Testing
Entry Element
، Integrated circuits-- Thermal properties
Entry Element
، Temperature measurements
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
A44
2002
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
by Josep Altet and Antonio Rubio
AU oinotnA ,oibuR 1954-
TI
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
05
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