Bias temperature instability for devices and circuits
نام عام مواد
[Book]
نام نخستين پديدآور
/ Tibor Grasser, editor
وضعیت نشر و پخش و غیره
محل نشرو پخش و غیره
New York
نام ناشر، پخش کننده و غيره
: Springer,
تاریخ نشرو بخش و غیره
, 2014.
يادداشت کلی
متن يادداشت
Print version:: Grasser, Tibor: Bias Temperature Instability for Devices and Circuits9781461479086.
یادداشتهای مربوط به نشر، بخش و غیره
متن يادداشت
Electronic
یادداشتهای مربوط به مندرجات
متن يادداشت
Summary: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Metal oxide semiconductor field-effect transistors