Bias temperature instability for devices and circuits
General Material Designation
[Book]
First Statement of Responsibility
/ Tibor Grasser, editor
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
: Springer,
Date of Publication, Distribution, etc.
, 2014.
GENERAL NOTES
Text of Note
Print version:: Grasser, Tibor: Bias Temperature Instability for Devices and Circuits9781461479086.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
CONTENTS NOTE
Text of Note
Summary: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
TOPICAL NAME USED AS SUBJECT
Metal oxide semiconductor field-effect transistors