عنوان
پدید آورنده
موضوع
رده
TK7871.85. G32 2000
TK7871
.
85
.
G32
2000
کتابخانه
محل استقرار
0803126158
9780803126152
b718277
Gate dielectric integrity :
[Book]
material, process, and tool qualification /
Dinesh C. Gupta and George A. Brown, editors.
West Conshocken, Pa. :
ASTM,
©2000.
xi, 169 pages :
illustrations ;
23 cm.
STP ;
1382
Conference on Gate Dielectric Integrity, held Jan. 25, 1999, San Jose, Calif.
Includes bibliographical references.
Dielectrics-- Testing.
Gate array circuits-- Materials.
Integrated circuits-- Wafer-scale integration-- Reliability.
Semiconductor wafers-- Reliability.
Silicon oxide films-- Testing.
Dielectrics-- Testing.
Gate array circuits-- Materials.
Integrated circuits-- Wafer-scale integration-- Reliability.
Semiconductor wafers-- Reliability.
621
.
3815/2
21
TK7871
.
85
.
G32
2000
Brown, George A.,1937-
Gupta, D. C., (Dinesh C.)
Conference on Gate Dielectric Integrity(1999 :, San Jose, Calif.)
20201208102550.0
مطالعه متن کتاب [Book]
Y
