1. An artificial intelligence approach to test generation
پدیدآورنده : by Narinder Singh
کتابخانه: Central Library of Campus 1 Technical University of Tehran (Tehran)
موضوع : Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
رده :
TK
7874
.
S533
1986
2. An artificial intelligence approach to test generation
پدیدآورنده : Singh, Narinder, 6591-
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
3. An artificial intelligence approach to test generation
پدیدآورنده : by Narinder Singh
کتابخانه: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
موضوع : Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (computer science),Artificial intelligence
رده :
TK
,
7874
,.
S533
,
1987