Proceedings : 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October 2001, San Francisco, California : proceedings
EDITION STATEMENT
Statement of Responsibility Relating to Edition
2001 : San Francisco, Calif.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Los Alamitos, Calif.
Name of Publisher, Distributor, etc.
IEEE Computer Society
Date of Publication, Distribution, etc.
c2001
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xiii, 468 p.: ill.
GENERAL NOTES
Text of Note
Also issued online.
Text of Note
Includes bibliographies
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ISBN: 0769512038
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
ORIGINAL VERSION NOTE
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1
TOPICAL NAME USED AS SUBJECT
Entry Element
Design and constructionn -- Congresses ، Integrated circuits -- Very large scale integration
Entry Element
Congresses ، Fault-tolerant computing
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
I338
2001
OTHER CLASS NUMBERS
Class number
NO
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
CO Institute of Electrical and Electronics Engineers
CO IEEE Computer Society. Fault-Tolerant Computing Technical Committee
CO IEEE Computer Society. Technical Council on Test Technology
TI
TI Defect and fault tolerance in VLSI Systems
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
Entry Element
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems