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Microelectronic Test Structures for CMOS Technology
پدید آورنده
/ Manjul Bhushan, Mark B. Ketchen
موضوع
INSTRUMENTATION& ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY|INSTRUMENTS &ENGINEERING, CIVIL|ENGINEERING, ELECTRICAL
رده
E-BOOK
کتابخانه
Central Library, Center of Documentation and Supply of Scientific Resources
محل استقرار
استان:
East Azarbaijan
ـ شهر:
تماس با کتابخانه :
04133443834
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9781441993779
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
EN-41515
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Microelectronic Test Structures for CMOS Technology
General Material Designation
[Book]
First Statement of Responsibility
/ Manjul Bhushan, Mark B. Ketchen
.PUBLICATION, DISTRIBUTION, ETC
Name of Publisher, Distributor, etc.
Springer
Date of Publication, Distribution, etc.
, 2011.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
TOPICAL NAME USED AS SUBJECT
INSTRUMENTATION& ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY|INSTRUMENTS &ENGINEERING, CIVIL|ENGINEERING, ELECTRICAL
LIBRARY OF CONGRESS CLASSIFICATION
Class number
E-BOOK
PERSONAL NAME - PRIMARY RESPONSIBILITY
Manjul Bhushan
ORIGINATING SOURCE
Country
ایران
ELECTRONIC LOCATION AND ACCESS
Host name
Microelectronic Test Structures for CMOS Technology
Access number
محرمانه
Compression information
محرمانه
Date and Hour of Consultation and Access
224973.pdf
Electronic Format Type
متن
old catalog
e
BL
1
a
Y
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