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RELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS
پدید آورنده
/ JOHNSTON ALLAN H
موضوع
ELECTRONIC&ENGINEERING, ELECTRICAL
رده
E-BOOK
کتابخانه
Central Library, Center of Documentation and Supply of Scientific Resources
محل استقرار
استان:
East Azarbaijan
ـ شهر:
تماس با کتابخانه :
04133443834
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9789814277112
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
EN-44514
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
RELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS
General Material Designation
[Book]
First Statement of Responsibility
/ JOHNSTON ALLAN H
.PUBLICATION, DISTRIBUTION, ETC
Name of Publisher, Distributor, etc.
WS
Date of Publication, Distribution, etc.
, 2010.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
TOPICAL NAME USED AS SUBJECT
ELECTRONIC&ENGINEERING, ELECTRICAL
LIBRARY OF CONGRESS CLASSIFICATION
Class number
E-BOOK
PERSONAL NAME - PRIMARY RESPONSIBILITY
JOHNSTON ALLAN H
ORIGINATING SOURCE
Country
ایران
ELECTRONIC LOCATION AND ACCESS
Host name
RELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS
Access number
محرمانه
Compression information
محرمانه
Date and Hour of Consultation and Access
200681.pdf
Electronic Format Type
متن
old catalog
e
BL
1
a
Y
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