INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9781461461630
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
EN-57637
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Analog IC Reliability in Nanometer CMO
General Material Designation
[Book]
First Statement of Responsibility
/ by Elie Maricau, Georges Gielen
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York, NY
Name of Publisher, Distributor, etc.
: Springer New York :Imprint: Springer,
Date of Publication, Distribution, etc.
, 2013.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
XVI, 198 p. 95 illus., 27 illus. in color., online resource.
SERIES
Series Title
(Analog Circuits and Signal Processing)
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
CONTENTS NOTE
Text of Note
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. ? Enables readers to understand long-term reliability of an integrated circuit; ? Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; ? Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; ? Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.
Text of Note
Introduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions.
SERIES
Title
Analog Circuits and Signal Processing
TOPICAL NAME USED AS SUBJECT
Engineering
Electronics
Systems engineering
Electronic books
LIBRARY OF CONGRESS CLASSIFICATION
Class number
E-BOOK
PERSONAL NAME - PRIMARY RESPONSIBILITY
Maricau, Elie.
PERSONAL NAME - SECONDARY RESPONSIBILITY
Gielen, Georges
SpringerLink (Online service)
ORIGINATING SOURCE
Country
ایران
ELECTRONIC LOCATION AND ACCESS
Host name
9781461461623.pdf
Access number
عادی
Compression information
عادی
Date and Hour of Consultation and Access
9781461461623.pdf
Electronic Format Type
متن
old catalog
e
BL
1
a
Y
