Characterization of semiconductor heterostructures and nanostructures
General Material Designation
[Book]
First Statement of Responsibility
/ edited by Carlo Lamberti
EDITION STATEMENT
Edition Statement
1st ed.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Amsterdam, Netherlands ;Boston [Mass.]
Name of Publisher, Distributor, etc.
: Elsevier,
Date of Publication, Distribution, etc.
, c2008.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
ix, 486 p., [3] p. of plates , ill. (some col.) , 25 cm.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
CONTENTS NOTE
Text of Note
Introduction: Theinterdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques /Carlo Lamberti --Ab initio studies of structural and electronic properties /Maria Peressi, Alfonso Baldereschi, and Stefano Baroni --Electrical characterization of nanostructures /Anna Cavallini and Laura Polenta --Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction /Claudio Ferrari and Claudio Bocchi --Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures /Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo --Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence /Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli --Power-dependent cathodoluminescence in III-nitrides heterostructures : from internal field screening to controlled band-gap modulation /Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini --Raman spectroscopy /Daniel Wolverson --X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures /Federico Boscherini --Nanostructures in the light of synchrotron radiation : surface-sensitive X-ray techniques and anomalous scattering /Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Scheulli --Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures /Maria Grazia Proietti, Johann Coraux, and Hubert Renevier --The role of photoemission spectroscopies in heterojunction research /Giorgio Margaritondo --ESR of interfaces and nanolayers in semiconductor heterostructures /Andre Stesmans and Valery V. Afanasسev.