Menu
Home
Advanced Search
Directory of Libraries
Languages
فارسی
English
العربی
عنوان
CMOS SRAM circuit design and parametric test in nano-scaled technologies :process-aware SRAM design and test
پدید آورنده
Pavlov, Andrei
موضوع
Design ، Metal oxide semiconductors, Complementary,، Random access memory,، Nanoelectronics
رده
TK
7871
.
99
.
M44P38
2008
کتابخانه
Library of Razi Metallurgical Research Center
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
46831570
-
021
OTHER STANDARD IDENTIFIER
Standard Number
electronic
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Pavlov, Andrei
Title Proper
CMOS SRAM circuit design and parametric test in nano-scaled technologies :process-aware SRAM design and test
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
]Dordrecht[
Name of Publisher, Distributor, etc.
Springer
Date of Publication, Distribution, etc.
c2008
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xvi, 193 p. : ill. ; 25 cm.
SERIES
Series Title
Frontiers in electronic testing ;04
GENERAL NOTES
Text of Note
Includes bibliographical references and index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
Andrei Pavlov, Manoj Sachdev
TOPICAL NAME USED AS SUBJECT
Entry Element
Design ، Metal oxide semiconductors, Complementary
Entry Element
، Random access memory
Entry Element
، Nanoelectronics
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44P38
2008
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU Sachdev, Manoj
TI
SE
Proposal/Bug Report
×
Proposal/Bug Report
×
Warning!
Enter The Information Carefully
Error Report
Proposal