عنوان

CMOS test and evaluation :

شابک

1493913484 (print)

شابک

1493913492

شابک

9781493913480 (print)

شابک

9781493913497

شابک اشتباه

9781493913480

شماره

dltt

عنوان اصلي

CMOS test and evaluation :

نام عام مواد

[Book]

ساير اطلاعات عنواني

a physical perspective /

نام نخستين پديدآور

Manjul Bhushan, Mark B. Ketchen

نام خاص و کميت اثر

1 online resource

متن يادداشت

Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation

بدون عنوان

0

متن يادداشت

This book extends test structure applications described in Microelectronic Test StrucU?tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters

شماره استاندارد بين المللي کتاب و موسيقي

9781493913480

موضوع مستند نشده

Electronics.

موضوع مستند نشده

Engineering.

موضوع مستند نشده

System safety.

موضوع مستند نشده

Systems engineering.

موضوع مستند نشده

Circuits and Systems.

موضوع مستند نشده

Electronics and Microelectronics, Instrumentation.

موضوع مستند نشده

Quality Control, Reliability, Safety and Risk.

موضوع مستند نشده

Semiconductors.

موضوع مستند نشده

TEC-- 009070

موضوع مستند نشده

TJF

شماره

ويراست

شماره رده

مستند نام اشخاص تاييد نشده

Bhushan, Manjul.

مستند نام اشخاص تاييد نشده

Ketchen, Mark B.

مستند نام تنالگان تاييد نشده

Ohio Library and Information Network.

تاريخ عمليات

20201222072153.6

قواعد فهرست نويسي ( بخش توصيفي )

pn

نام الکترونيکي

نوع ماده

[Book]

کد کاربرگه

270410

تكميل شده

Y