IR
EN-12981
انگلیسی
IR
silicon validation for VLSI circuits-based post-Trace
[Book]
/ Xiao Liu, Qiang Xu (auth.)
Springer International Publishing
, 2014.
Electronic
ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY& ARCHITECTURE|ENGINEERING, ELECTRICAL &COMPUTER SCIENCE, HARDWARE
E-BOOK
Xiao Liu
ایران
Trace-based post-silicon validation for VLSI circuits
عادی
محرمانه
1637790.pdf
متن
old catalog
e
BL
1
a
Y
