9781420043761 (alk. paper)
IR
E-8683
انگلیسی
IR
Defects in microelectronic materials and devices
[Book]
/ edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
Boca Raton
: CRC Press,
, c2009.
xvi, 753 p.
: ill.
; 26 cm.
Print - Electronic
Includes bibliographical references and index.
Microelectronics--Materials--Testing
Metal oxide semiconductor field-effect transistors--Testing
Integrated circuits--Defects
621
.
381
TK7871
.
D44
2009
Fleetwood, D. M
Pantelides, Sokrates T
Schrimpf, Ronald Donald
ایران
Defects in microelectronic materials and devices
عادی
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E-8683
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