عنوان
پدید آورنده
موضوع
رده
TK 7874.65 .B44 1995
TK
7874
.
65
.
B44
1995
کتابخانه
محل استقرار
CE R1
Beenker, Frans P. M.
Testability concepts for digital ICs : the macro test approach
Dordrecht, Boston
Kluwer Academic Publishers
1995
ix, 212 p. : ill
Frontiers in electronic testing ; vol. 3
Includes bibliographical references )p. 197-205(
Digital integrated circuits - Testing
Automatic checkout equipment
TK
7874
.
65
.
B44
1995
AU
by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
English
