عنوان

Electron diffraction and high-resolution electron microscopy of mineral structures

0387173234

3540173234

3642717314

9780387173238

9783540173236

9783642717314

b573031

Electron diffraction and high-resolution electron microscopy of mineral structures

[Book]

Victor A. Drits.

Berlin ; New York

Springer-Verlag

©1987.

xii, 304 pages : illustrations ; 25 cm

Translation of: Strukturnoe issledovanie mineralov metodami mikrodifrakt︠s︡ii ėlektronov i ėlektronnoĭ mikroskopii vysokogo razreshenii︠a︡.

1 Geometrical Features of the Crystal and the Reciprocal Lattices.- 1.1 Crystal Structure and Crystal Lattice.- 1.2 The Bragg Equation. Reciprocal Lattice. Relationships Between the Indices of Lines and Planes in the Direct and Reciprocal Lattices.- 1.3 The Ewald Sphere and the Geometrical Interpretation for Diffraction Patterns.- 2 The Kinematical Theory of Scattering of Electrons by Crystals. Intensity of Diffraction Reflections.- 2.1 Wave-Like Properties of Electrons.- 2.2 The Kinematical Theory of Scattering of Waves by Crystals.- 2.3 Behavior of Electrons in Medium, the Schroedinger Equation, Its Solution in the Kinematical Approximation.- 2.4 Atomic Scattering Amplitudes, or f-Curves.- 2.5 Structure Amplitude and Structure Factor.- 2.6 Reflection Intensities in Point Electron Diffraction Patterns in Terms of the Kinematical Approximation.- 3 Geometrical Analysis of Point Electron-Diffraction Patterns.- 3.1 Raypath in a Transmission Electron Microscope for Imaging and Selected Area Diffraction.- 3.2 Methods for Interpretation of Point Diffraction Patterns: Indexing and Determination of Unit Cells.- 3.3 Simulation of Diffraction Patterns for Objects with Known Unit Cell and Space Symmetry.- 3.4 Interpretation and Simulation of Diffraction Patterns for Triclinic Lattices with a Fixed Coordinate Plane.- 3.5 Determination of the Bravais Cell and the Space Group. Secondary Diffraction Effects.- 4 Diffraction Methods in Structure Analysis.- 4.1 Fourier Series and Integrals: Their Role in the Theory of Diffraction.- 4.2 Fourier Series: Representation for the Electrostatic Potential and Use in Structure Analysis.- 4.3 The Trial-And-Error Method.- 4.4 Interatomic Vector Space. Patterson Function: Properties and Application to Structure Analysis.- 4.5 Direct Phasing Methods.- 4.6 Refinement of Atomic Coordinates by the Least-Squares Method.- 5 Dynamical Theory of Electron Diffraction (Two-Beam Approximation).- 5.1 Quantum-Mechanical Solution.- 5.2 Integrated Diffraction Intensity in Terms of the Two-Beam Dynamical Theory.- 5.3 Criteria for the Range of Validity of the Kinematical Approximation.- 6 Dynamical n-Beam Scattering of Electrons.- 6.1 The "Physical Optics" Approach.- 6.2 Numerical Methods for Calculation of Diffraction Patterns.- 7 Electron Diffraction and High-Resolution Electron Microscopy.- 7.1 Diffraction Effects and Formation of High-Resolution Electron-Microscopic Images.- 7.2 Fraunhofer Diffraction: An Intermediate Stage in the Transfer of Information Between the Object and the Image.- 7.3 Factors Defining the Contrast in Electron-Microscopic Images.- 7.4 Contrast in Electron-Microscopic Images of Thin Crystals.- 7.5 Direct Crystal Structure Determination Methods Under the WPOA.- 7.6 High-Resolution Electron Microscopy (HREM) of Crystals.- 7.7 HREM and Real Structure of Crystals.- 7.8 Simulation of HREM Images.- 7.9 High-Resolution High-Voltage Electron Microscopy (HRHVEM).- 8 Oblique-Texture Electron Diffraction.- 8.1 General.- 8.2 OTED Patterns: Peculiarities of Geometrical Arrangement of Reflections and Integrated Intensities.- 8.3 Two-Dimensional Intensity Distribution in OTED Patterns.- 8.4 Factors Affecting Diffracted Intensities.- 8.5 A Technique for OTED Intensity Measurements.- 8.6 Crystal Structure Refinements of Mica Polytypes on the Basis of Electronometric Intensity Measurement.- 8.7 Determination of Hydrogen Positions in Mica Structures by OTED.- 8.8 Study of Octahedral Cation Distribution in 2:1 Layers of Dioctahedral Smectites.- 9 SAED and HREM Study of Mixed-Layer Minerals.- 9.1 Hybrid-Structure Minerals.- 9.2 Structure Analysis of Hybrid Minerals.- 9.3 Crystal Structure of Tochilinite.- 9.4 Structure Analysis of Minerals Related to Tochilinite.- 9.5 The Crystal Structure of Valleriite.- 9.6 A Three-Component Hybrid Mineral Containing Brucite- Like, Sulfide and Silicate Layers.- 9.7 Forms of Structural Heterogeneity.- 9.8 Structure Study of Asbolanes.- 9.9 Analysis of Basal Reflection Intensities in SAED Studies of Mixed-Layer Minerals.- 9.10 Structure Studies of Mixed-Layer Minerals by HREM.- 10 SAED and HREM Study of Order/Disorder and Structural Heterogeneity in Layer Minerals.- 10.1 A New Mica NaMg3(Si3.5Mg0.5)O10(OH)2 Having a Talc- Like Stacking Sequence.- 10.2 Diffraction Effects from Layer Structures Having Partially Ordered Cation Distribution.- 10.3 Structural Modulations Resulting from the Lateral Misfit of Octahedral and Tetrahedral Sheets in Phyllosilicates.- 11 Chain Silicates. New Structural Types: Multiple-Chain and Mixed-Chain Minerals.- 11.1 New Problems in the Structure Study of Chain Silicates.- 11.2 Pyroxenes and Amphiboles: Idealized Structures.- 11.3 Fluorocupfferite Mg7 [Si8O22F2], a New Amphibole Variety.- 11.4 Crystal Structures of Triple-Chain Silicates.- 11.5 New Minerals Having Regular Mixed-Chain Structures.- 11.6 Some Methodological Aspects in the Interpretation for Point SAED Patterns from Chain Silicates.- 11.7 Direct HREM Observation of the Structural Motif of Asbestiform Chain Silicates.- 11.8 Chain-Width Disorder in Chain Silicates.- 11.9 Contrast Distribution in a-Axis HREM Images for Chain- Silicate Crystals Having Chain-Width Disorder.- 11.10 Structural Features of Chain Silicates Revealed in c-Axis HREM Images.- References.

Strukturnoe issledovanie mineralov metodami mikrodifrakt︠s︡ii ėlektronov i ėlektronnoĭ mikroskopii vysokogo razreshenii︠a︡.

High resolution electron microscopy.

Mineralogy, Determinative.

Optical mineralogy.

Victor A. Drits.

V A Drit︠s︡

[Book]

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