عنوان
پدید آورنده
موضوع
رده
TK7871.85 .P426 1993
TK7871
.
85
.
P426
1993
کتابخانه
محل استقرار
0125507704
9780125507707
dltt
Optical characterization of semiconductors :
[Book]
infrared, Raman, and photoluminescence spectroscopy /
Sidney Perkowitz
x, 220 pages :
illustrations ;
25 cm
Techniques of physics ;
14
Includes bibliographical references (pages 207-215) and index
1. Introduction -- 2. Optical Theory for Semiconductor Characterization -- 3. Optical Physics of Semiconductors -- 4. Measurement Methods -- 5. Case Studies: Photoluminescence Characterization -- 6. Case Studies: Raman Characterization -- 7. Case Studies: Infrared Characterization -- 8. Summary and Future Trends
2
Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods
For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time
Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience
There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering
Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors
Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique
Optical characterization of semiconductors.
Semiconductors-- Testing-- Optical methods
621
.
3815/2/0287
20
TK7871
.
85
.
P426
1993
Perkowitz, Sidney
20160712055312.0
مطالعه متن کتاب [Book]
Y
