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Microelectronics failure analysis :
پدید آورنده
edited by The Electronic Device Failure Analysis Society, Desk Reference Committee
موضوع
Microelectronics-- Defects-- Testing, Handbooks, manuals, etc,Microelectronics-- Materials-- Testing, Handbooks, manuals, etc
رده
TK7874
.
58
.
M53
2004
کتابخانه
کتابخانه مطالعات اسلامی به زبان های اروپایی
محل استقرار
استان:
قم
ـ شهر:
قم
تماس با کتابخانه :
32910706
-
025
0871708043
dltt
Microelectronics failure analysis :
[Book]
desk reference /
edited by The Electronic Device Failure Analysis Society, Desk Reference Committee
5th ed
Materials Park, Ohio :
ASM International,
c2004
xiv, 800 p. :
ill. ;
28 cm. +
1 CD-ROM (4 3/4 in.)
Includes bibliographical references and index
Introduction -- Failure analysis process flow -- Failure verification -- Failure mode: failure classifications -- Special devices -- Non-destructive analysis techniques -- Depackaging -- Photon emission (electroluminescence) localization techniques -- Microthermography -- Laser and particle beam-based localization techniques -- Deprocessing -- General imaging techniques -- Local deprocessing and imaging -- Materials analysis techniques -- Important topics for semiconductor devices -- FA techniques/tools roadmaps -- FA operation and management -- Appendix
0
System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic
Microelectronics-- Defects-- Testing, Handbooks, manuals, etc
Microelectronics-- Materials-- Testing, Handbooks, manuals, etc
TK7874
.
58
.
M53
2004
Electronic Device Failure Analysis Society., Desk Reference Committee
20041229122610.0
مطالعه متن کتاب
[Book]
Y
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