عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
9783540389675
9783642083723
b407059
Scanning Electron Microscopy
[Book]
Physics of Image Formation and Microanalysis /
by Ludwig Reimer.
Second Completely Revised and Updated Edition.
Berlin, Heidelberg :
Imprint: Springer,
1998.
Springer Series in Optical Sciences,
45
0342-4111 ;
Electron Optics of a Scanning Electron Microscope -- Electron Scattering and Diffusion -- Emission of Backscattered and Secondary Electrons -- Electron Detectors and Spectrometers -- Image Contrast and Signal Processing -- Electron-Beam-Induced Current and Cathodoluminescence -- Special Techniques in SEM -- Crystal Structure Analysis by Diffraction -- Elemental Analysis and Imaging with X-Rays.
0
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
9783642083723
Springer eBooks
Physics.
Reimer, Ludwig.
SpringerLink (Online service)
20190307161800.0
مطالعه متن کتاب [Book]
Y
