عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
9781475744064
9781475744088
b403821
Advanced Computing in Electron Microscopy
[Book]
by Earl J. Kirkland.
Boston, MA :
Imprint: Springer,
1998.
1 Introduction -- 2 The Transmission Electron Microscope -- 3 Linear Image Approximations -- 4 Sampling and the Fast Fourier Transform -- 5 Simulating Images of Thin Specimens -- 6 Simulating Images of Thick Specimens -- 7 Multislice Applications and Examples -- 8 The Programs on the CD-ROM -- A Plotting CTEM/STEM Transfer Functions -- B Files on the CD-ROM -- C The Fourier Projection Theorem -- D Atomic Potentials and Scattering Factors -- D.1 Atomic Charge Distribution -- D.2 X-Ray Scattering Factors -- D.3 Electron Scattering Factors -- D.4 Parameterization -- E Bilinear Interpolation -- F 3D Perspective View.
0
pending
9781475744088
Springer eBooks
Computer engineering.
Engineering.
Optical materials.
Surfaces (Physics).
Kirkland, Earl J.
SpringerLink (Online service)
20190301073300.0
مطالعه متن کتاب [Book]
Y
