عنوان
پدید آورنده
موضوع
رده
E-Book ,
E-Book
,
کتابخانه
محل استقرار
9789400776623
39769
انگلیسی
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
[electronic resources]
Jacopo Franco • Ben Kaczer ,Guido Groeseneken
Dordrecht : Springer, 2014.
xix, 187p.
ill.
Springer Series in Advanced Microelectronics 47
Bibliography
Metal oxide semiconductor field-effect transistors > Reliability. Metal oxide semiconductors, Complementary > Reliability.
E-Book
,
Franco, Jacopo, author. Contributor Kaczer, Ben, author. Groeseneken, Guido, author.
ایران
مطالعه متن کتاب BL
279177
a
N
