Symposium on X-Ray and Electron Probe Analysis; presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963
Philadelphia
American Society for Testing and Materials
1964
vi, 209 p. illus. 24 cm.
ASTM special technical publicationno. 943
Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography
Includes bibliographies
Congresses ، X-ray spectroscopy
Congresses ، Probes )Electronic instruments(
QD
95
.
S95
1964
AU
CO ASTM Committee E-2 on Emission Spectroscopy
CO American Society for Testing and Materials.Committee E-4 on Metallography
TI
SE
Symposium on X-Ray and Electron Probe Analysis)1963 :Atlantic City(