عرض القائمة
الرئیسیة
البحث المتقدم
قائمة المکتبات
إختر اللغة
فارسی
English
العربی
عنوان
Unified methods for VLSI simulation and test generation
پدید آورنده
Cheng, Kwang- Ting, 1691-
موضوع
، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Computer- aided design,، Integrated circuits- Very large scale integration- Testing,، Integrated circuits- Very large scale integration- Computer simulation
رده
کتابخانه
كتابخانه پژوهشگاه نیرو
محل استقرار
استان:
طهران
ـ شهر:
طهران
تماس با کتابخانه :
9
-
88079401
-
021
4704
Cheng, Kwang- Ting, 1691-
Unified methods for VLSI simulation and test generation
Boston
Kluwer Academic Publishers
c1989
xii, 148 p. :ill. ;24 cm
The Kluwer international series in engineering and computer science ; SECS 37
At head of title: AT&T
Includes index
Bibliography: p. ]113[- 143
، Integrated circuits- Very large scale integration- Design and construction- Data processing
، Computer- aided design
، Integrated circuits- Very large scale integration- Testing
، Integrated circuits- Very large scale integration- Computer simulation
621
.
39/5
TK
7874
.
C525
1989
AU
by Kwang- Ting Cheng and Vishwani D. Agrawal
AU -3491 ,.D inawhsiV ,lawargA
TI
الاقتراح / اعلان الخلل
×
الاقتراح / اعلان الخلل
×
تحذیر!
دقق في تسجیل المعلومات
اعلان الخلل
اقتراح