عنوان
پدید آورنده
موضوع
رده
TK 7870 .S95
TK
7870
.
S95
کتابخانه
محل استقرار
108002
108003
تابستان۵۷
English
)12(
Reliability physics
New York
Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers
v.: ill.; 28 cm.
Annual
Began with vol. for 1970
Description based on: 19th )Apr. 7-9, 1981(
Includes bibliographical references
References: Index to IEEE publications, ISSN 0099-1368
Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, )1974-1978(; the IEEE Electron Devices Society and the IEEE Reliability Society, )1981- (
Continues: Reliability Physics Symposium. Proceedings
ISSN 0735-0791=Reliability physics
Congresses ، Electronic apparatus and appliances-- Reliability
Congresses ، Electronic apparatus and appliances-- Testing
Congresses ، Integrated circuits-- Reliability
Congresses ، Integrated circuits-- Testing
TK
7870
.
S95
AU
CO IEEE Electron Devices Society
CO IEEE Reliability Group
CO IEEE Reliability Society
CO Institute of Electrical and Electronics Engineers, Electron Devices Group
TI
International Reliability Physics Symposium
131
131
