1. Unified methods for VLSI simulation and test generation

پدیدآورنده :

کتابخانه: كتابخانه پژوهشگاه نیرو (تهران)

موضوع : ، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Computer- aided design,، Integrated circuits- Very large scale integration- Testing,، Integrated circuits- Very large scale integration- Computer simulation

2. Unified methods for VLSI simulation and test generation

پدیدآورنده :

کتابخانه: كتابخانه مركزی و مركز اطلاع رسانی دانشگاه شاهد (تهران)

موضوع : Integrated circuits- Very large scale integration- Computer-aided design,Integrated circuits- Very large scale integration- Testing,Integrated circuits- Very large scale integration- Computer simulation

رده :
TK
،
7874
،.
C525
،
1989