عنوان

A parallel testing algorithm for pattern sensitive faults in random access memory

شماره

TLpq230778141

زبان متن نوشتاري يا گفتاري و مانند آن

انگلیسی

عنوان اصلي

A parallel testing algorithm for pattern sensitive faults in random access memory

نام عام مواد

[Thesis]

نام نخستين پديدآور

S. Lu

نام ساير پديدآوران

M. Ashtijou

نام ناشر، پخش کننده و غيره

Texas A&M University - Kingsville

تاریخ نشرو بخش و غیره

1994

نام خاص و کميت اثر

154

جزئيات پايان نامه و نوع درجه آن

M.S.

کسي که مدرک را اعطا کرده

Texas A&M University - Kingsville

امتياز متن

1994

متن يادداشت

A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N write operations and 480 N read operations for Type-1 neighborhood, and it needs 129 N write operations and 192 N read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.

موضوع مستند نشده

Applied sciences

موضوع مستند نشده

Computer science

موضوع مستند نشده

Electrical engineering

مستند نام اشخاص تاييد نشده

M. Ashtijou

مستند نام اشخاص تاييد نشده

S. Lu

نام الکترونيکي

فرمت انتشار

p

نوع ماده

[Thesis]

کد کاربرگه

276903

سطح دسترسي

a

تكميل شده

Y