عنوان

Wafer-level testing and test during burn-in for integrated circuits /

شابک

1596939907

شابک

9781596939905

شابک اشتباه

1596939893

شابک اشتباه

9781596939899

شماره

b765492

عنوان اصلي

Wafer-level testing and test during burn-in for integrated circuits /

نام عام مواد

[Book]

نام نخستين پديدآور

Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

محل نشرو پخش و غیره

Boston :

نام ناشر، پخش کننده و غيره

Artech House,

تاریخ نشرو بخش و غیره

2010.

نام خاص و کميت اثر

1 online resource (xv, 198 pages) :

ساير جزييات

illustrations

عنوان فروست

Artech House integrated microsystems series

متن يادداشت

Includes bibliographical references and index.

متن يادداشت

Wafer-Level Test and Burn-In: Industry Practices and Trends -- Resource-Constrained Testing of Core-Based ScCs -- Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs -- Wafer-Level Test During Burn-In: Test Scheduling for Core-Based SoCs -- Wafer-Level Test During Burn-In: Power Management by Test-Pattern Ordering -- Wafer-Level Test During Burn-In: Power Management by Test-Pattern Manipulation.

بدون عنوان

0

متن يادداشت

Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.

عنوان

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

شماره استاندارد بين المللي کتاب و موسيقي

1596939893

موضوع مستند نشده

Integrated circuits-- Testing.

موضوع مستند نشده

Integrated circuits-- Wafer-scale integration.

موضوع مستند نشده

Semiconductors-- Testing.

موضوع مستند نشده

Integrated circuits-- Testing.

موضوع مستند نشده

Integrated circuits-- Wafer-scale integration.

موضوع مستند نشده

Semiconductors-- Testing.

موضوع مستند نشده

TECHNOLOGY & ENGINEERING-- Electronics-- Digital.

موضوع مستند نشده

TECHNOLOGY & ENGINEERING-- Electronics-- Microelectronics.

موضوع مستند نشده

TEC-- 008060

موضوع مستند نشده

TEC-- 008070

شماره

ويراست

شماره رده

نشانه اثر

مستند نام اشخاص تاييد نشده

Bahukudumbi, Sudarshan.

مستند نام اشخاص تاييد نشده

Chakrabarty, Krishnendu.

تاريخ عمليات

20201206110109.0

قواعد فهرست نويسي ( بخش توصيفي )

pn

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y