یادداشتهای مربوط به کتابنامه ، واژه نامه و نمایه های داخل اثر
متن يادداشت
Includes bibliographical references and index.
یادداشتهای مربوط به مندرجات
متن يادداشت
Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Circulant Matrix Representation of Feature Masks and Its Applications; Phase Problem and Reference-Beam Diffraction; Fractal Encoding; Morphologically Debiased Classifier Fusion: A Tomography-Theoretic Approach; index.
بدون عنوان
0
یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
یادداشتهای مربوط به سفارشات
منبع سفارش / آدرس اشتراک
Elsevier Science & Technology
شماره انبار
110479:110528
ویراست دیگر از اثر در قالب دیگر رسانه
عنوان
Advances in imaging and electron physics. Volume 134.