عنوان

Scanning Tunneling Microscopy II :

شابک

3642973639

شابک

9783642973635

شماره

b576692

عنوان اصلي

Scanning Tunneling Microscopy II :

نام عام مواد

[Book]

ساير اطلاعات عنواني

Further Applications and Related Scanning Techniques

نام نخستين پديدآور

edited by Roland Wiesendanger, Hans-Joachim Güntherodt.

محل نشرو پخش و غیره

Berlin, Heidelberg

نام ناشر، پخش کننده و غيره

Springer Berlin Heidelberg

تاریخ نشرو بخش و غیره

1992

نام خاص و کميت اثر

(xiv, 308 pages 159 illustrations)

عنوان فروست

Springer series in surface sciences, 28.

متن يادداشت

1. Introduction --; 1.1 STM in Electrochemistry and Biology --; 1.2 Probing Small Forces on a Small Scale --; 1.3 Related Scanning Probe Microscopies --; 1.4 Nanotechnology --; References --; 2. STM in Electrochemistry --; 2.1 Principal Aspects --; 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes --; 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes --; 2.4 Outlook --; References --; 3. The Scanning Tunneling Microscope in Biology --; 3.1 Instrumentation --; 3.2 Processing of STM Images --; 3.3 Preparation --; 3.4 Applications --; 3.5 Imaging and Conduction Mechanisms --; 3.6 Conclusions --; References --; 4. Scanning Force Microscopy (SFM) --; 4.1 Experimental Aspects of Force Microscopy --; 4.2 Forces and Their Relevance to Force Microscopy --; 4.3 Microscopic Description of the Tip--Sample Contact --; 4.4 Imaging with the Force Microscope --; 4.5 Conclusions and Outlook --; References --; 5. Magnetic Force Microscopy (MFM) --; 5.1 Basic Principles of MFM --; 5.2 Measurement Techniques --; 5.3 Force Sensors --; 5.4 Theory of MFM Response --; 5.5 Imaging Data Storage Media --; 5.6 Imaging Soft Magnetic Materials --; 5.7 Resolution --; 5.8 Separation of Magnetic and Topographic Signals --; 5.9 Comparison with Other Magnetic Imaging Techniques --; 5.10 Conclusions and Outlook --; References --; 6. Related Scanning Techniques --; 6.1 Historical Background --; 6.2 STM and Electrical Measurements --; 6.3 STM and Optical Effects --; 6.4 Near-Field Thermal Microscopy --; 6.5 Scanning Force Microscopy and Extensions --; 6.6 Conclusion --; References --; 7. Nano-optics and Scanning Near-Field Optical Microscopy --; 7.1 Nano-optics: Optics of Nanometer-Size Structures --; 7.2 Experimental Work --; 7.3 Plasmons and Spectroscopic Effects --; 7.4 Imaging by SNOM --; 7.5 Discussion, Outlook, Conclusions --; References --; 8. Surface Modification with a Scanning Proximity Probe Microscope --; 8.1 Overview --; 8.2 Microfabrication with a Scanning Probe Microscope --; 8.3 Investigation of the Fabrication Process --; 8.4 Review of SXM Lithography --; References.

متن يادداشت

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.

موضوع مستند نشده

Cytology.

موضوع مستند نشده

Physical organic chemistry.

موضوع مستند نشده

Physics.

شماره رده

نشانه اثر

مستند نام اشخاص تاييد نشده

edited by Roland Wiesendanger, Hans-Joachim Güntherodt.

مستند نام اشخاص تاييد نشده

Hans-Joachim Güntherodt

مستند نام اشخاص تاييد نشده

Roland Wiesendanger

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y