عنوان

Terrestrial radiation effects in ULSI devices and electronic systems /

شابک

1118479297

شابک

1118479300

شابک

1118479319

شابک

1118479327

شابک

9781118479292

شابک

9781118479308

شابک

9781118479315

شابک

9781118479322

شابک اشتباه

9781118479292

شماره

dltt

عنوان اصلي

Terrestrial radiation effects in ULSI devices and electronic systems /

نام عام مواد

[Book]

نام نخستين پديدآور

Eishi H. Ibe

نام خاص و کميت اثر

1 online resource

متن يادداشت

Includes bibliographical references and index

متن يادداشت

Introduction -- Basic Knowledge on Terrestrial Secondary Particles -- CMOS Semiconductor Devices and Systems -- Two Major Fault Modes: Charge Collection and Bipolar Action -- Four Hierarchies in Faulty Conditions in Electronic Systems: Fault-Error-Hazard-Failure -- Historical Background of Soft-Error Research -- General Scope of This Book -- References -- Terrestrial Radiation Fields -- General Sources of Radiation -- Backgrounds for Selection of Terrestrial High-Energy Particles -- Spectra at the Avionics Altitude -- Radioisotopes in the Field -- Summary of Chapter 2 -- References -- Fundamentals of Radiation Effects -- General Description of Radiation Effects -- Definition of Cross Section -- Radiation Effects by Photons (Gamma-ray and X-ray) -- Radiation Effects by Electrons (Beta-ray) -- Radiation Effects by Muons -- Radiation Effects by Protons -- Radiation Effects by Alpha-Particles -- Radiation Effects by Low-Energy Neutrons -- Radiation Effects by High-Energy Neutrons -- Radiation Effects by Heavy Ions -- Summary of Chapter 3 -- References -- Fundamentals of Electronic Devices and Systems -- Fundamentals of Electronic Components -- DRAM (Dynamic Random Access Memory) -- CMOS Inverter -- SRAM (Static Random Access Memory) -- Floating Gate Memory (Flash Memory) -- Sequential Logic Devices -- Combinational Logic Devices -- Fundamentals of Electronic Systems -- FPGA (Field Programmable Gate Array) -- Processor -- Summary of Chapter 4 -- References -- Irradiation Test Methods for Single Event Effects -- Field Test -- Alpha Ray SEE Test -- Heavy Ion Particle Irradiation Test -- Proton Beam Test -- Muon Test Method -- Thermal/Cold Neutron Test Methods -- High-Energy Neutron Test -- Medium-Energy Neutron Source by Using Radioisotopes -- Monoenergetic Neutron Test -- Quasi-Monoenergetic Neutron Test -- Spallation Neutron Test -- Attenuation of Neutron Flux and Energy -- Testing Conditions and Matters That Require Attention -- Memories -- Circuits -- Summary of Chapter 5 -- References -- Integrated Device Level Simulation Techniques -- Overall Multi-scale and Multi-physics Soft-Error Analysis System -- Relativistic Binary Collision and Nuclear Reaction Models -- Energy Bin Setting for a Particle Energy Spectrum -- Relativistic Binary Collision Model -- ALS (Absolute Laboratory System) and ALLS (Aligned Laboratory System) -- Intra-nuclear Cascade (INC) Model for High-Energy Neutrons and Protons -- Penetration of a Nucleon into a Target Nucleus -- Calculation of Probability of Binary Callision between Two Nucleons in the Target Nucleus -- Determination of Condition in Nucleon-Nucleon Collision -- Evaporation Model for High-Energy Neutrons and Protons -- Generalised Evaporation Model (GEM) for Inverse Reaction Cross Sections -- Neutron Capture Reaction Model -- Automated Device Modelling -- Setting of Random Position of Spallation Reaction Point in a Component -- Algorithms for Ion Tracking -- Fault Mode Models -- Calculation of Cross Section -- Prediction for Scaling Effects of Soft Error Down to 22 nm Design Rule in SRAMs -- Evaluation of Effects of Heavy Elements in Semiconductor Devices by Nuclear Spallation Reaction -- Upper Bound Fault Simulation Model -- Upper Bound Fault Simulation Results -- Electrons -- Muons -- Direct Ionisation by Proton -- Proton Spallation -- Low-Energy Neutron -- High-Energy Neutron Spallation -- Comparison of Secondary Cosmic Rays -- Upper Bound Simulation Method for SOC (System On Chip) -- Summary of Chapter 6 -- References -- Prediction, Detection and Classification Techniques of Faults, Errors and Failures -- Overview of Failures in the Field -- Prediction and Estimation of Faulty Conditions due to SEE -- Substrate/Well/Device Level -- Circuit Level -- Chip/Processor Level -- Board Level -- Operating System Level -- Application Level -- In-situ Detection of Faulty Conditions due to SEE -- Substrate/Well Level -- Device Level -- Circuit Level -- Chip/Processor Level -- Board/OS/Application Level -- Classification of Faulty Conditions -- Classification of Faults -- Classification of Errors in Time Domain -- MCU Classification Techniques of Memories in Topological Space Domain -- Classification of Errors in Sequential Logic Devices -- Classification of Failures: Chip/Board Level Partial/Full Irradiation Test -- Faulty Modes in Each Hierarchy -- Fault Modes -- Error Modes -- Failure Modes -- Summary of Chapter 7 -- References -- Mitigation Techniques of Failures in Electronic Components and Systems -- Conventional Stack-layer Based Mitigation Techniques, Their Limitations and Improvements -- Substrate/Device Level -- Circuit/Chip/Processor Layer -- Multi-core Processor -- Board/OS/Application Level -- Real-Time Systems: Automotives and Avionics -- Limitations and Improvements -- Challenges for Hyper Mitigation Techniques -- Co-operations of Hardware and Software -- Mitigation of Failures under Variations in SEE Responses -- Cross-Layer Reliability (CLR)/Inter-Layer Built-In Reliability (LABIR) -- Symptom-Driven System Resilient Techniques -- Comparison of Mitigation Strategies for System Failure -- Challenges in the Near Future -- Summary of Chapter 8 -- References -- Summary -- Summaru of Terrestrial Radiation Effects on ULSI Devices and Electronic Systems -- Directions and Challenges in the Future

بدون عنوان

0

منبع سفارش / آدرس اشتراک

Safari Books Online

شماره انبار

CL0500000547

عنوان

Terrestrial radiation effects in ULSI devices and electronic systems.

شماره استاندارد بين المللي کتاب و موسيقي

9781118479292

موضوع مستند نشده

Electronic circuits-- Effect of radiation on.

موضوع مستند نشده

Integrated circuits-- Effect of radiation on.

موضوع مستند نشده

Integrated circuits-- Ultra large scale integration-- Reliability.

موضوع مستند نشده

TEC-- 009070

شماره

ويراست

شماره رده

مستند نام اشخاص تاييد نشده

Ibe, Eishi H.

مستند نام تنالگان تاييد نشده

Ohio Library and Information Network.

تاريخ عمليات

20160603081420.3

قواعد فهرست نويسي ( بخش توصيفي )

pn

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y