Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication
نام عام مواد
[Book]
ساير اطلاعات عنواني
From Particle Scale to Feature, Die and Wafer Scales /
نام نخستين پديدآور
by Jianfeng Luo, David A. Dornfeld.
وضعیت نشر و پخش و غیره
محل نشرو پخش و غیره
Berlin, Heidelberg :
نام ناشر، پخش کننده و غيره
Imprint: Springer,
تاریخ نشرو بخش و غیره
2004.
یادداشتهای مربوط به مندرجات
متن يادداشت
Introduction -- Review of CMP Modeling -- Material Removal Mechanism in CMP -- Effects of Abrasive Size Distribution in CMP -- Material Removal Regions in CMP -- One and Semi-Two Dimensional Feature- and Die-Scale Modeling for the Damascene Process -- Three-Dimensional Feature-Scale Modeling of CMP -- Wafer-Scale Modeling of CMP -- Summary and Future work.
بدون عنوان
0
یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
This book is the product of a developing research focus on CMP at Berkeley. Its focus is on the important area of process models which have not kept pace with the tremendous expansion of applications of CMP. It specifically deals with the development of models with sufficient detail to allow the evaluation and tradeoff of process inputs and parameters to assess impact on quality or quantity of production. The important role of the mechanical elements of the process are included in such an "integrated model". The objective of the book is to introduce some background on the overlooked mechanical aspects of the process - including pad surface topography and abrasive particles. The "integrated model" can be particularly useful as one looks towards optimization of the process, design of consumables and, importantly, looking to minimize the environmental affects of CMP.
ویراست دیگر از اثر در قالب دیگر رسانه
شماره استاندارد بين المللي کتاب و موسيقي
9783642061158
قطعه
عنوان
Springer eBooks
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Chemistry, Physical organic.
موضوع مستند نشده
Electronics.
موضوع مستند نشده
Engineering.
موضوع مستند نشده
Optical materials.
موضوع مستند نشده
Surfaces (Physics).
نام شخص به منزله سر شناسه - (مسئولیت معنوی درجه اول )