عنوان

Defect Oriented Testing for CMOS Analog and Digital Circuits

شابک

9781475749267

شابک

9781475749281

شماره

b403826

عنوان اصلي

Defect Oriented Testing for CMOS Analog and Digital Circuits

نام عام مواد

[Book]

نام نخستين پديدآور

by Manoj Sachdev.

محل نشرو پخش و غیره

Boston, MA :

نام ناشر، پخش کننده و غيره

Imprint: Springer,

تاریخ نشرو بخش و غیره

1999.

عنوان فروست

Frontiers in Electronic Testing,

مشخصه جلد

10

شاپا ي ISSN فروست

0929-1296 ;

متن يادداشت

1 Introduction -- 2 Digital CMOS Fault Modeling and Inductive Fault Analysis -- 3 Defects in Logic Circuits and Their Test Implications -- 4 Testing Defects in Sequential Circuits -- 5 Defect Oriented RAM Testing and Current Testable RAMs -- 6 Testing Defects in Programmable Logic Circuits -- 7 Defect Oriented Analog Testing -- 8 Conclusion.

بدون عنوان

0

متن يادداشت

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

شماره استاندارد بين المللي کتاب و موسيقي

9781475749281

عنوان

Springer eBooks

موضوع مستند نشده

Computer engineering.

موضوع مستند نشده

Engineering design.

موضوع مستند نشده

Engineering.

مستند نام اشخاص تاييد نشده

Sachdev, Manoj.

مستند نام تنالگان تاييد نشده

SpringerLink (Online service)

تاريخ عمليات

20190301080500.0

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y