INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9781420043761 (alk. paper)
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
E-8683
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Defects in microelectronic materials and devices
General Material Designation
[Book]
First Statement of Responsibility
/ edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boca Raton
Name of Publisher, Distributor, etc.
: CRC Press,
Date of Publication, Distribution, etc.
, c2009.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xvi, 753 p.
Other Physical Details
: ill.
Dimensions
; 26 cm.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Print - Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
TOPICAL NAME USED AS SUBJECT
Microelectronics--Materials--Testing
Metal oxide semiconductor field-effect transistors--Testing
Integrated circuits--Defects
DEWEY DECIMAL CLASSIFICATION
Number
621
.
381
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7871
Book number
.
D44
2009
PERSONAL NAME - SECONDARY RESPONSIBILITY
Fleetwood, D. M
Pantelides, Sokrates T
Schrimpf, Ronald Donald
ORIGINATING SOURCE
Country
ایران
ELECTRONIC LOCATION AND ACCESS
Host name
Defects in microelectronic materials and devices
Access number
عادی
Compression information
عادی
Electronic name
E-8683.pdf
Bits per second
0
Contact for access assistance
ایمانی
Electronic Format Type
متن
File size
0
Record control number
E-8683
Public note
انگلیسی
old catalog
pe
BL
1
a
Y
