عنوان

CMOS test and evaluation :

(Number (ISBN

1493913484 (print)

(Number (ISBN

1493913492

(Number (ISBN

9781493913480 (print)

(Number (ISBN

9781493913497

Erroneous ISBN

9781493913480

Number

dltt

Title Proper

CMOS test and evaluation :

General Material Designation

[Book]

Other Title Information

a physical perspective /

First Statement of Responsibility

Manjul Bhushan, Mark B. Ketchen

Specific Material Designation and Extent of Item

1 online resource

Text of Note

Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation

0

Text of Note

This book extends test structure applications described in Microelectronic Test StrucU?tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters

International Standard Book Number

9781493913480

Electronics.

Engineering.

System safety.

Systems engineering.

Circuits and Systems.

Electronics and Microelectronics, Instrumentation.

Quality Control, Reliability, Safety and Risk.

Semiconductors.

TEC-- 009070

TJF

Number

Edition

Class number

Bhushan, Manjul.

Ketchen, Mark B.

Ohio Library and Information Network.

Date of Transaction

20201222072153.6

Cataloguing Rules (Descriptive Conventions))

pn

Electronic name

[Book]

270410

Y