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عنوان
Computed electron micrographs and defect identification

پدید آورنده
By A.K. Head, P. Humble, L.M. Clarebrough, a.o.

موضوع
Electron microscopy-- Data processing.,Metals-- Defects-- Data processing.,cristallographie.,diffraction.,dislocation.,identification défaut.,physique.,Cristallographie-- Informatique.,Cristaux-- Défauts.,Électrons-- Diffraction.,Computersimulaties.,Electron microscopy-- Data processing.,Elektronendiffractie.,Elektronenmicroscopie.,Metall.,Metals-- Defects-- Data processing.,Mikrostruktur.,Roosterfouten.,SCIENCE-- Physics-- Crystallography.,Vastestoffysica.

رده

کتابخانه
Center and Library of Islamic Studies in European Languages

محل استقرار
استان: Qom ـ شهر: Qom

Center and Library of Islamic Studies in European Languages

تماس با کتابخانه : 32910706-025

INTERNATIONAL STANDARD BOOK NUMBER

(Number (ISBN
0444601473
(Number (ISBN
0720417570
(Number (ISBN
9780444601476
(Number (ISBN
9780720417579
Erroneous ISBN
0444104623
Erroneous ISBN
9780444104625

NATIONAL BIBLIOGRAPHY NUMBER

Number
b401579

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
Computed electron micrographs and defect identification
General Material Designation
[Book]
First Statement of Responsibility
By A.K. Head, P. Humble, L.M. Clarebrough, a.o.

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Amsterdam :
Name of Publisher, Distributor, etc.
North-Holland Pub. Co.,
Date of Publication, Distribution, etc.
1973.

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
1 online resource (x, 400 pages :
Other Physical Details
illustrations).

SERIES

Series Title
Defects in crystalline solids,
Volume Designation
v. 7

INTERNAL BIBLIOGRAPHIES/INDEXES NOTE

Text of Note
Includes bibliographical references (p. [387]-389).

OTHER EDITION IN ANOTHER MEDIUM

Title
Computed electron micrographs and defect identification.

PARALLEL TITLE PROPER

Parallel Title
Electron micrographs and defect identification

TOPICAL NAME USED AS SUBJECT

Electron microscopy-- Data processing.
Metals-- Defects-- Data processing.
cristallographie.
diffraction.
dislocation.
identification défaut.
physique.
Cristallographie-- Informatique.
Cristaux-- Défauts.
Électrons-- Diffraction.
Computersimulaties.
Electron microscopy-- Data processing.
Elektronendiffractie.
Elektronenmicroscopie.
Metall.
Metals-- Defects-- Data processing.
Mikrostruktur.
Roosterfouten.
SCIENCE-- Physics-- Crystallography.
Vastestoffysica.

PERSONAL NAME - ALTERNATIVE RESPONSIBILITY

Head, A. K.

CORPORATE BODY NAME - ALTERNATIVE RESPONSIBILITY

ScienceDirect (Online service)

ORIGINATING SOURCE

Date of Transaction
20140731102927.0
Cataloguing Rules (Descriptive Conventions))
pn

ELECTRONIC LOCATION AND ACCESS

Electronic name
 مطالعه متن کتاب 

[Book]

Y

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