Advances in speckle metrology and related techniques
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Weinheim
Name of Publisher, Distributor, etc.
Wiley-VCH
Date of Publication, Distribution, etc.
2011
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xviii, 309 p.: ill. ; 25 cm.
GENERAL NOTES
Text of Note
Includes bibliographical references and index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
edited by Guillermo H. Kaufmann
CONTENTS NOTE
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Radial Speckle Interferometry and Applications / Armando Albertazzi Goncalves, Matias R Viotti -- Depth-Resolved Displacement Field Measurement / Jonathan M Huntley, Pablo D Ruiz -- Single-Image Interferogram Demodulation / Manuel Servin, Julio Estrada, Antonio Quiroga -- Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods / Alejandro Federico, Guillermo H Kaufmann -- Optical Vortex Metrology / Wei Wang, Steen G Hanson, Mitsuo Takeda -- Speckle Coding for Optical and Digital Data Security Applications / Arvind Kumar, Madan Singh, Kehar Singh