عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
TLpq230778141
انگلیسی
A parallel testing algorithm for pattern sensitive faults in random access memory
[Thesis]
S. Lu
M. Ashtijou
Texas A&M University - Kingsville
1994
154
M.S.
Texas A&M University - Kingsville
1994
A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N write operations and 480 N read operations for Type-1 neighborhood, and it needs 129 N write operations and 192 N read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.
Applied sciences
Computer science
Electrical engineering
M. Ashtijou
S. Lu
مطالعه متن کتاب p
[Thesis]
276903
a
Y
