16261
16340
Snyder, Robert L.
1491-
Defect and microstructure analysis by diffraction
Oxford ; New York
Oxford University Press
1999
xxii, 785 p. : ill
International Union of Crystallography monographs on crystallography
10
Includes bibliographical references and index
Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge
Defects -- Analysis ، Crystals
، Diffraction
، X-ray crystallography
548/
.
83
QD
945
.
S58
1999
AU
AU Fiala, Jaroslav
AU Bunge, Hans Joachim
TI
SE
CL
CL
