یادداشتهای مربوط به کتابنامه ، واژه نامه و نمایه های داخل اثر
متن يادداشت
Includes bibliographical references and index..
یادداشتهای مربوط به مندرجات
متن يادداشت
Summary: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
فروست (داده ارتباطی)
عنوان
Springer series in surface sciences
شماره جلد
v.52
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Ellipsometry
موضوع مستند نشده
Physics
موضوع مستند نشده
Surface and Interface Science, Thin Films
موضوع مستند نشده
Surfaces and Interfaces, Thin Films
موضوع مستند نشده
Physical Chemistry
موضوع مستند نشده
Optics, Optoelectronics, Plasmonics and Optical Devices