عنوان

Radiation hardened CMOS integrated circuits for time-based signal processing /

شابک

3319786164

شابک

9783319786162

شابک اشتباه

3319786156

شابک اشتباه

9783319786155

عنوان اصلي

Radiation hardened CMOS integrated circuits for time-based signal processing /

نام عام مواد

[Book]

نام نخستين پديدآور

Jeffrey Prinzie, Michiel Steyaert, Paul Leroux.

محل نشرو پخش و غیره

Cham, Switzerland :

نام ناشر، پخش کننده و غيره

Springer,

تاریخ نشرو بخش و غیره

2018.

نام خاص و کميت اثر

1 online resource

عنوان فروست

Analog circuits and signal processing,

شاپا ي ISSN فروست

1872-082X

متن يادداشت

Includes bibliographical references and index.

متن يادداشت

Intro; Preface; Contents; List of Abbreviations and Symbols; Abbreviations; Symbols; List of Figures; List of Tables; 1 Radiation Effects in CMOS Technology; 1.1 Radiation and Its Interaction with Matter; 1.1.1 Direct Ionization; 1.1.2 Electromagnetic Radiation; 1.1.3 Neutrons; 1.1.4 Effects on Semiconductors; 1.2 Total Ionizing Dose Effects; 1.2.1 Basic Charge Trapping in CMOS Transistors; 1.2.2 Narrow Channel Transistors; 1.2.3 Short Channel Transistors; 1.2.4 Enclosed Layout Transistors; 1.2.5 Experimental Results; 1.3 Single-Event Effects; 1.3.1 Basic Mechanism.

متن يادداشت

1.3.2 Effect on nmos and pmos Devices1.3.3 SET, SEU, SEL; 1.3.4 SEU Mitigation Techniques in Digital Blocks; 1.3.5 Charge Sharing; 1.4 Simulation Methods to Simulate Radiation Effects; 1.4.1 Simulation of TID Effects on Circuits; 1.4.2 Simulation of Single-Event Effects on Circuits; 1.5 Conclusion; 2 Time-Domain Signal Processing; 2.1 Introduction; 2.2 Time-to-Digital Converters; 2.3 Applications of Time-Based Circuits; 2.3.1 High-Energy Physics; 2.3.2 PET Scanners; 2.3.3 Time-of-Flight LIDAR; 2.3.4 All-Digital PLLs; 2.4 TDC Circuits; 2.4.1 Performance Parameters.

متن يادداشت

2.4.1.1 Single-Shot Precision2.4.1.2 Linearity; 2.4.1.3 Gain Error; 2.4.1.4 Conversion Speed; 2.4.2 Delay-Line Based TDCs; 2.4.3 Sub-gate Delay-Line TDCs; 2.4.3.1 Vernier Architecture; 2.4.3.2 Local Phase Interpolation; 2.4.3.3 Parallel TDCs; 2.4.4 Delay-Locked Loops; 2.4.5 Multi-Stage TDCs; 2.4.5.1 Coarse-Fine TDCs; 2.4.5.2 Pipelined TDCs; 2.4.6 Looped TDCs; 2.4.7 Oversampling TDCs; 2.4.7.1 Gated Ring-Oscillator; 2.4.8 Other TDC Architectures; 2.4.8.1 Stochastic TDCs; 2.4.8.2 Wave Union Launcher; 2.4.9 Input Path; 2.5 Conclusion; 3 Clock Synthesizers; 3.1 Introduction; 3.2 Phase Locked Loops.

متن يادداشت

3.2.1 Phase-Domain Model3.2.2 Components for Charge-Pump PLLs; 3.2.2.1 Phase Detector; 3.2.2.2 Phase-Frequency Detector; 3.2.2.3 Bang-Bang Phase Detector; 3.2.2.4 Charge-Pump: Loop Filter; 3.2.2.5 Divider; 3.3 Oscillators; 3.3.1 Oscillation Criteria; 3.3.2 LC-Oscillators; 3.3.3 Ring-Oscillators; 3.4 Jitter and Phase-Noise; 3.4.1 Definitions; 3.4.2 Phase Noise in LC-Tank Oscillators; 3.4.2.1 Linear Calculation; 3.4.2.2 Impulse Sensitive Function; 3.4.3 Phase Noise Spectrum of an Oscillator; 3.5 Phase-Noise in PLLs; 3.5.1 Noise Transfer Function; 3.5.2 Reference Clock Phase Noise.

متن يادداشت

3.5.3 Charge-Pump: Loop Filter3.5.4 Oscillator; 3.5.5 Spurious Tones; 3.6 Performance Parameters; 3.7 Conclusion; 4 Single Shot Time-to-Digital Converters; 4.1 Introduction; 4.2 TDC System Level Architecture; 4.2.1 Self-Calibration Loop Implemented by a DLL; 4.2.2 System Architecture with Double Phase Detector; 4.2.3 TDC Timing Generator Linearity; 4.2.4 Channeling and Basic Readout Interfaces; 4.3 Low Offset Bang-Bang Phase Detector; 4.3.1 Origin of Static Phase Offsets; 4.3.2 Removing Static Phase Offsets; 4.3.3 Circuit Implementations; 4.4 Experimental Results; 4.5 Conclusion.

بدون عنوان

0

بدون عنوان

8

بدون عنوان

8

بدون عنوان

8

بدون عنوان

8

متن يادداشت

This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.

منبع سفارش / آدرس اشتراک

Springer Nature

شماره انبار

com.springer.onix.9783319786162

عنوان

Radiation hardened CMOS integrated circuits for time-based signal processing.

شماره استاندارد بين المللي کتاب و موسيقي

9783319786155

موضوع مستند نشده

Integrated circuits.

موضوع مستند نشده

Metal oxide semiconductors, Complementary.

موضوع مستند نشده

Circuits & components.

موضوع مستند نشده

Electronics engineering.

موضوع مستند نشده

Imaging systems & technology.

موضوع مستند نشده

Integrated circuits.

موضوع مستند نشده

Metal oxide semiconductors, Complementary.

موضوع مستند نشده

TECHNOLOGY & ENGINEERING-- Mechanical.

موضوع مستند نشده

TEC-- 009070

موضوع مستند نشده

TJFC

شماره

ويراست

شماره رده

مستند نام اشخاص تاييد نشده

Prinzie, Jeffrey

مستند نام اشخاص تاييد نشده

Leroux, Paul,1975-

مستند نام اشخاص تاييد نشده

Steyaert, Michiel,1959-

تاريخ عمليات

20200823113549.0

قواعد فهرست نويسي ( بخش توصيفي )

pn

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y