Ion tracks in materials research and microtechnology / R. Spohr --; Rare gases in metals : influence on the formation and nucleation of cavities / R. Schumacher and R. Vianden --; Plasma-wall interaction in controlled thermonuclear fusion research / R. Behrisch --; Novel applications of narrow nuclear resonances / C. Rolfs --; Molecular dynamics simulation of cluster-ion impacts / T.A. Tombrello --; Channeling : a marriage of atomic collision physics and materials science / S. Datz --; The Frankfurt ECR-RFQ ion-beam facility for slow highly charged ions / H. Schmidt-Böcking, A. Schempp, and K.E. Stiebing --; Role of ion beams in superconductor research / O. Meyer --; Slow particle-induced electron emission from above and below metal surfaces / H. Winter --; Electrons captured and emitted by highly charged ions near surfaces / R. Morgenstern, L. Folkerts, and J. Das. Semiconductor detectors for nuclear radiation : a review / S. Kalbitzer.
یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Ion bombardment -- Congresses.
موضوع مستند نشده
Ion bombardment.
موضوع مستند نشده
Materials -- Effect of radiation on -- Congresses.
رده بندی کنگره
شماره رده
TA418
.
6
نشانه اثر
H734
1992
نام شخص به منزله سر شناسه - (مسئولیت معنوی درجه اول )
مستند نام اشخاص تاييد نشده
H. Schmidt-Böcking, A. Schempp, K.E. Stiebing, eds.