عنوان

Microstructural characterization of materials /

شابک

0470027843 (cloth)

شابک

0470027851 (pbk.)

شابک

9780470027844 (cloth)

شابک

9780470027851 (pbk.)

شماره

dltt

عنوان اصلي

Microstructural characterization of materials /

نام عام مواد

[Book]

نام نخستين پديدآور

David Brandon and Wayne D. Kaplan

وضعيت ويراست

2nd ed

محل نشرو پخش و غیره

Chichester, England :

نام ناشر، پخش کننده و غيره

John Wiley,

تاریخ نشرو بخش و غیره

c2008

نام خاص و کميت اثر

xiv, 536 p. :

ساير جزييات

ill. (some col.) ;

ابعاد

25 cm

عنوان فروست

Quantitative software engineering series

متن يادداشت

Includes bibliographical references and index

متن يادداشت

The concept of microstructure -- Microstructural features -- Crystallography & crystal structure -- Diffraction analysis of crystal structure -- Scattering Of radiation by crystals -- Reciprocal space -- X-ray diffraction methods -- Diffraction analysis -- Electron diffraction -- Optical microscopy -- Geometrical optics -- Construction of the microscope -- Specimen preparation -- Image contrast -- Working with digital images -- Resolution, contrast & image interpretation -- Transmission electron microscopy -- Basic principles -- Specimen preparation -- The origin of contrast -- Kinematic interpretation of diffraction contrast -- Dynamic diffraction & absorption effects -- Lattice imaging at high resolution -- Scanning transmission electron microscopy -- Scanning electron microscopy -- Components of the scanning electron microscope -- Electron beam - specimen interactions -- Electron excitation of x-rays -- Back-scattered electrons -- Secondary Electron Emission -- Alternative Imaging Modes -- Specimen Preparation & Topology -- Focused Ion Beam Microscopy -- Microanalysis in electron microscopy -- X-Ray Microanalysis -- Electron Energy-Loss Spectroscopy -- Scanning probe microscopy & related techniques -- Surface Forces & Surface Morphology -- Scanning Probe Microscopes -- Field-ion Microscopy & Atom-Probe Tomography -- Chemical analysis of surface composition -- X-Ray Photoelectron Spectroscopy -- Auger Electron Spectroscopy -- Secondary-Ion Mass Spectrometry -- Quantitative & tomographic analysis of microstructure -- Basic Stereological Concepts -- Accessible & Inaccessible Parameters -- Optimizing accuracy -- Automated Image analysis -- Tomography & three dimensional reconstruction

بدون عنوان

0

متن يادداشت

"The book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this second edition of Microstructural Characterization of Materials explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis." "The book should appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who should find the book a useful and comprehensive general reference source."--BOOK JACKET

موضوع مستند نشده

Materials-- Microscopy

موضوع مستند نشده

Microstructure

موضوع مستند نشده

Materiais

موضوع مستند نشده

Microscopia

شماره

ويراست

شماره رده

نشانه اثر

مستند نام اشخاص تاييد نشده

Brandon, D. G

مستند نام اشخاص تاييد نشده

Kaplan, Wayne D

تاريخ عمليات

20130909115318.0

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y