یادداشتهای مربوط به کتابنامه ، واژه نامه و نمایه های داخل اثر
متن يادداشت
Includes bibliographical references and index.
یادداشتهای مربوط به مندرجات
متن يادداشت
Fundamentals of scanning electron microscopy / Weilie Zhou ... [et al.] -- Backscattering detector and EBSD in nanomaterials characterization / Tim Maitland and Scott Sitzman -- X-ray microanalysis in nanomaterials / Robert Anderhalt -- Low kW scanning electron microscopy / M. David Frey -- E-beam nanolithography integrated with scanning electron microscope / Joe Nabity ... [et al.] -- Scanning transmission electron microscopy for nanostructure characterization / S.J. Pennycook ... [et al.] -- Introduction to in-situ nanomanipulation for nanomaterials engineering / Rishi Gupta and Richard E. Stallcup, II -- Applications of FIB and DualBeam for nanofabrication / Brandon Van Leer, Lucille A. Giannuzzi, and Paul Anzalone -- Nanowires and carbon nanotubes / Jianye Li and Jie Liu -- Photonic crystals and devices / Xudong Wang and Zhong Lin Wang -- Nanoparticles and colloidal self-assembly / Gabriel Caruntu, Daniela Caruntu, and Charles J. O'Connor -- Nano-building blocks fabricated through templates / Feng Li and John B. Wiley -- One-dimensional wurtzite semiconducting nanostructures / Pu Xian Gao and Zhong Lin Wang -- Bio-inspired nanomaterials / Peng Wang ... [et al.] -- Cryo-temperature stages in nanostructural research / Robert P. Apkarian.
بدون عنوان
0
یادداشتهای مربوط به نیازمندی های سیستم (منابع الکترونیک)و جزئیات فنی
متن يادداشت
Mode of access: World Wide Web.
ویراست دیگر از اثر در قالب دیگر رسانه
عنوان
Scanning microscopy for nanotechnology : techniques and applications